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Generic gamma correction for accuracy enhancement in fringe-projection profilometryHOANG, Thang; BING PAN; NGUYEN, Dung et al.Optics letters. 2010, Vol 35, Num 12, pp 1992-1994, issn 0146-9592, 3 p.Article

Trace and profile measurements for dynamic objectsSU, Wei-Hung; KUO, Cho-Yo.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8120, issn 0277-786X, isbn 978-0-8194-8730-8, 812011.1-812011.6Conference Paper

Clustering-driven residue filter for profile measurement systemJUNJIANG; JUN CHENG; YING ZHOU et al.Journal of the Optical Society of America. A, Optics, image science, and vision (Print). 2011, Vol 28, Num 2, pp 214-221, issn 1084-7529, 8 p.Article

Inner Crack Reconstruction and Mechanical Analysis for Rock Specimens Based Phase Measuring ProfilometryYIPING CAO; YUHANG HE.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7522, issn 0277-786X, isbn 978-0-8194-7912-9, 75225A.1-75225A.8, 3Conference Paper

Phase-shifting laser diode Sagnac interferometer for surface profile measurementSUZUKI, Takamasa; SHIRAI, Masato; SASAKI, Osami et al.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 6829, pp 68290A.1-68290A.8, issn 0277-786X, isbn 978-0-8194-7004-1 0-8194-7004-X, 1VolConference Paper

Erreurs de forme, de position, d'orientation, de battement. Partie 3BONZOM, Christian; FARGIER, Eric.Techniques de l'ingénieur. Mesures et contrôle. 2005, Vol RD1, Num R1222, issn 0399-4147, R1222.1-R1222.8, docR1223.1 [9 p.]Article

Performance assessment of involute gear measurement by CMM using a double-ball artifactTAKATSUJI, Toshiyuki; KONDO, Koshi; KUBO, Aizo et al.SPIE proceedings series. 2005, pp 58790Q.1-58790Q.7, isbn 0-8194-5884-8, 1VolConference Paper

3D shape reconstruction using multiple projections : a method to eliminate shadowing for projected fringe profilometrySU, Wei-Hung; KUO, Cho-Yo.Proceedings of SPIE, the International Society for Optical Engineering. 2007, pp 669811.1-669811.11, issn 0277-786X, isbn 978-0-8194-6846-8, 1VolConference Paper

Design and calibration of an elastically guided CMM axis with nanometer repeatabilitySEGGELEN, J. K. V; ROSIELLE, P. C. J. N; SCHELLEKENS, P. H. J et al.SPIE proceedings series. 2005, pp 58790T.1-58790T.8, isbn 0-8194-5884-8, 1VolConference Paper

Additional Comments on An Essay on Contact Angle Measurements by M. Strobel and C. S. LyonsMONTES RUIZ-CABELLO, Francisco Javier; RODRIGUEZ-VALVERDE, Miguel Angel; CABRERIZO-VILCHEZ, Miguel A et al.Plasma processes and polymers (Print). 2011, Vol 8, Num 5, pp 363-366, issn 1612-8850, 4 p.Article

The identification and repair of anomalous measurements in the measurement of big diameter based on rolling-wheel methodCHEN, Haiou; YU, Xiaofen.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 7997, issn 0277-786X, isbn 978-0-8194-8570-0, 79971G.1-79971G.6, 2Conference Paper

Projected fringe profilometry using the area-encoded algorithm for dynamic and complex objectsSU, Wei-Hung.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7056, pp 70561X.1-70561X.9, issn 0277-786X, isbn 978-0-8194-7276-2 0-8194-7276-X, 1VolConference Paper

A primary roundness measuring machineTHALMANN, Ruedi; SPILLER, Jürg.SPIE proceedings series. 2005, pp 58790E.1-58790E.10, isbn 0-8194-5884-8, 1VolConference Paper

The detection of cyclic nonlinearities in a ZMI2000 heterodyne interferometerTHIJSSE, Jorrit; JAMTING, Asa K; BROWN, Nick et al.SPIE proceedings series. 2005, pp 58790M.1-58790M.11, isbn 0-8194-5884-8, 1VolConference Paper

The partial plane level of terrace and its testLIU, Ya-Nan; ZENG, Jian-Kang; LIU, Jun-Qu et al.SPIE proceedings series. 2000, pp 251-254, isbn 0-8194-3718-2Conference Paper

Verification of a polarization-insensitive optical interferometer system with subnanometric capabilityDOWNS, M. J; BIRCH, K. P; COX, M. G et al.Precision engineering. 1995, Vol 17, Num 2, pp 84-88, issn 0141-6359Article

Modified Fourier transform method for 3D profile measurement without phase unwrappingYAJUN WANG; SHENG YANG; XUYAN GOU et al.Optics letters. 2010, Vol 35, Num 5, pp 790-792, issn 0146-9592, 3 p.Article

Sensor of total hip arthroplasty wear designed on pronciple of scanning profilometryRÖSSLER, Tomas; MANDAT, Dusan; GALLO, Jiri et al.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7141, pp 71411E.1-71411E.8, issn 0277-786X, isbn 9780819473837Conference Paper

Design of structured light by using three PM fibers for Moiré interferometric profilometryLIBO YUAN.Proceedings of SPIE, the International Society for Optical Engineering. 2007, pp 659549.1-659549.7, issn 0277-786X, isbn 978-0-8194-6727-0, 2VolConference Paper

Near common-path optical fiber interferometer for potentially fast on-line microscale-nanoscale surface measurementXIANGQIAN JIANG; KAIWEI WANG; MARTIN, Haydn et al.Optics letters. 2006, Vol 31, Num 24, pp 3603-3605, issn 0146-9592, 3 p.Article

A new approach to determining the key comparison reference valueBROWN, N.SPIE proceedings series. 2005, pp 58790W.1-58790W.7, isbn 0-8194-5884-8, 1VolConference Paper

Three-dimensional profile measurement of small lens using subpixel localization with color gratingLIN, Chern-Sheng; LIN, Chia-Hau; LIN, Chi-Chin et al.Optik (Stuttgart). 2010, Vol 121, Num 23, pp 2122-2127, issn 0030-4026, 6 p.Article

Unified approach for rough phase measurement without phase unwrapping by changing the sensitivity factorHUANG, Y. H; LIU, L; CHEN, Y. S et al.Journal of modern optics (Print). 2009, Vol 56, Num 9, pp 1070-1077, issn 0950-0340, 8 p.Article

The 36 channel simultaneously sampling ADC Card for Linac-4 Secondary Emission grids and LHC DC transformersKASPROWICZ, Grzegorz.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7124, pp 71240L.1-71240L.7, issn 0277-786X, isbn 978-0-8194-7358-5 0-8194-7358-8, 1VolConference Paper

Accurate phase-height mapping algorithm for PMPYONG LI; XIANYU SU; QINGYANG WU et al.Journal of modern optics (Print). 2006, Vol 53, Num 14, pp 1955-1964, issn 0950-0340, 10 p.Article

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